In-situ TEM Observations of Growth and Characterization of Nano-sized Branched Structures on Insulator Substrates in an Electron-beam-induced Deposition Process | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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In-situ TEM Observations of Growth and Characterization of Nano-sized Branched Structures on Insulator Substrates in an Electron-beam-induced Deposition Process

HASEGAWA, Akira, Guoqiang Xie, MITSUISHI, Kazutaka, FURUYA, Kazuo.

Proc. of The 16th International Congress on Electron Microscopy 1199-1199. 2006.

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三石和貴

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作成時刻: 2017-02-27 01:07:36 +0900 更新時刻: 2017-03-17 03:07:17 +0900

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