HOME > 会議録 > 書誌詳細(Invited) Direct Observation of Electronic States in Gate Stack Structures: XPS under Device OperationYoshiyuki Yamashita, Hideki Yoshikawa, Toyohiro Chikyo, Keisuke Kobayashi. /proceedings?q=proceeding_title_text%3A%22%22 . 2011.https://doi.org/10.1149/1.3633313 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-07-01 18:12:14 +0900更新時刻: 2024-04-02 04:28:03 +0900
