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(Invited) Direct Observation of Electronic States in Gate Stack Structures: XPS under Device Operation

Yoshiyuki Yamashita, Hideki Yoshikawa, Toyohiro Chikyo, Keisuke Kobayashi.
/proceedings?q=proceeding_title_text%3A%22%22 . 2011.
https://doi.org/10.1149/1.3633313

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