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Common Bias Readout for TES Array on Scanning Transmission Electron Microscope

R. Yamamoto, K. Sakai, K. Maehisa, K. Nagayoshi, T. Hayashi, H. Muramatsu, Y. Nakashima, K. Mitsuda, N. Y. Yamasaki, Y. Takei, M. Hidaka, S. Nagasawa, K. Maehata, T. Hara.
JOURNAL OF LOW TEMPERATURE PHYSICS 454-459. 2016.
https://doi.org/10.1007/s10909-016-1562-4

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