HOME > Proceedings > DetailAnnealing of tungsten supertip fabricated on AFM probe by electron-beam-induced depositionLIU, ZHIQUAN, MITSUISHI, Kazutaka, FURUYA, Kazuo. Proceedings of the 16th International Microscopy Congress 980-980. 2006.NIMS author(s)MITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 01:09:01 +0900 Updated at: 2017-03-17 03:08:39 +0900