HOME > Proceedings > DetailPRECIPITATION OF XE IONS IN BORON CRYSTALS STUDIED WITH ANALYTICAL TEM(硼素結晶に埋められているXe析出物の分析電子顕微鏡法による解析)HASEGAWA, Akira, チュー フーミン, MITSUISHI, Kazutaka, FURUYA, Kazuo, 保田英洋, NODA, Tetsuji. Proceedings of 15th International Congress on Electron Microscopy 757-758. 2002.NIMS author(s)MITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 00:09:14 +0900 Updated at: 2017-03-17 02:13:18 +0900