X-ray absorption microspectroscopy with electrostatic force microscopy and its application to chemical states analyses of Si oxide nano structures (静電気力顕微鏡を使ったX線吸収顕微分光とその酸化Siナノ構造の化学状態分析への応用)
ISHII, Masashi, N. Rigopoulos, N. R. J. Poolton, Bruce Hamilton.