HOME > 会議録 > 書誌詳細Characterization of xenon nanoprecipitates embedded in aluminium crystals by means of 3-D TEM HASEGAWA, Akira, Hajime Matsumoto, Masayuki Shimojo, TAKEGUCHI, Masaki, MITSUISHI, Kazutaka, FURUYA, Kazuo. Proceedings of The 9th asia-pacific Microscopy Conference (APMC9) 229-230. 2008.NIMS著者竹口 雅樹三石 和貴Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 01:31:28 +0900 更新時刻: 2017-03-17 03:33:08 +0900
