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Raman Spectroscopic Measurement of a Vacuum-Deposited C60 Thin Film
| Author(s) | KONNO, Toshio, Lingling Ren, Erlon H Martins Ferreira, Guangzhe Piao, José Manuel Juárez García, Froy Martínez Suárez, Sergio J. Jimenez-Sandoval, WAKAHARA, Takatsugu, MIYAZAWA, Kunichi. |
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| Proceedings title | PROCEEDINGS OF THE INTERNATIONAL CONFERENCE NANOMATERIALS: APPLICATIONS AND PROPERTIES |
| Year of publication | 2015 |
| Language | English |