HOME > 会議録 > 書誌詳細Trapping mechanism of charge trap capacitor with Al2O3/High-k/Al2O3 multilayerToshihide Nabatame. ECS transactions 131-138. 2017.https://doi.org/10.1149/07901.0131ecst NIMS著者生田目 俊秀Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-08-01 22:56:43 +0900更新時刻: 2024-09-05 04:35:46 +0900
