HOME > 会議録 > 書誌詳細Compositional Characterization of Nano-materials and Thin Films with Secondary Ion MassspectrometryH. Haneda, K. Matsumoto, N. Saito, I. Sakaguchi, N. Ohashi, M. Fujimoto. Proceedings of IEEE International Nanoelectronics Conference (INEC) 2008 . 2008.https://doi.org/10.1109/inec.2008.4585450 NIMS著者齋藤 紀子坂口 勲大橋 直樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 01:26:20 +0900 更新時刻: 2026-05-29 05:04:36 +0900
