HOME > Proceedings > DetailDevelopment of measurement system of thermoelectric properties of thin films in the thickness directionSHINOHARA, Yoshikazu, H.Kawakami, ISODA, Yukihiro. Proc. 14th International Symposium on FGMs 154-157. 2016.NIMS author(s)SHINOHARA, YoshikazuISODA, YukihiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 02:58:15 +0900Updated at: 2018-06-05 14:04:54 +0900