HOME > Presentation > Detail(Stress measurement on Si surface using micromechanical cantilever sensor technique and Raman microscopy)五十嵐 慎一, 北島 正弘, 板倉 明子. European conference on surface science 23. 2005.NIMS author(s)ITAKURA, AkikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-25 00:57:02 +0900Updated at: 2017-07-10 19:20:42 +0900