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NIMS Award Symposium 2026

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摩擦力顕微鏡原子分解能観察による MOCVD-MoS2成膜過程の S 欠陥定量評価
(Atomic-scale quantitative evaluation of S defects during MOCVD-MoS2 film formation by friction force microscopy)

松本 昂征, 西村 知紀, 金橋 魁利, 佐久間 芳樹, 長汐 晃輔.
第73回応用物理学春季学術講演会. March 15, 2026-March 18, 2026.

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Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2026-06-19 03:06:51 +0900 Updated at: 2026-06-19 03:06:51 +0900

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