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シリコン表面酸化中の表面応力変動におよぼす表面不均一性の効果
(Effect of Surface Disorder on the Surface Stress of Si(100)during Oxidation)

成島哲也(筑波大), 板倉 明子, 河辺隆也, 北島 正弘, 成島哲也(筑波大), 河辺隆也.
Third International Symposium on Control of Semiconductor Interf. October 25, 1999-October 29, 1999.

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    Created at: 2017-02-14 11:36:32 +0900 Updated at: 2017-07-10 17:56:41 +0900

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