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(Electronic properties of LaNiO3 Mott interfaces via hard X-ray photoemission)
VUVX 2010. 2010.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 10:51:32 +0900Updated at: 2017-07-10 20:51:44 +0900