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(Electron holography combined with a stage-scanning system)

竹口 雅樹, 三石 和貴, Dan Lei, 下条 雅幸.
IUMAS-V: 5th International Union of Microbeam Analysis Societies. May 22, 2011-May 27, 2011. Invited

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    Created at: 2017-01-08 04:30:31 +0900 Updated at: 2024-03-05 11:43:29 +0900

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