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放射光アシストプローブ顕微鏡:静電容量・静電気力を使った化学マッピングと吸収分光
(Synchrotron-radiation assisted scanning probe microscopy: Chemical mapping and absorption spectroscopy by using capacitance and electrostatic force)
物性研短期研究会「顕微分光とナノサイエンスの発展」. February 22, 2010-February 23, 2010. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:04:59 +0900 Updated at: 2024-03-05 11:42:53 +0900