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走査型マイクロ波顕微鏡によるシリコン基板上BaxSr1-yTiO3薄膜の誘電率特性の高速評価
(The dielectric characterization of the combinatorial synthesized sample libraries by scanning microwave microscope)
第43回応用物理学関係連合講演会（平成13年春季応用物理学会）. March 28, 2001-March 31, 2001.
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Created at: 2017-01-08 05:12:59 +0900 Updated at: 2017-07-10 18:13:49 +0900