HOME > Presentation > DetailDevelopment of Ultrahigh- Vacuum Cs Corrected Scanning Transmission Electron MicroscopeMITSUISHI, Kazutaka. 10th Conference on Frontiers of Electron Microscopy in Materials. 2005.NIMS author(s)MITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 11:44:08 +0900Updated at: 2022-09-05 11:44:08 +0900