HOME > Presentation > DetailSi(111)-4x1-In 電気伝導度の異方性測定(Anisotropic electronic conductance of Si(111)-4x1-In)内橋 隆, Urs RAMASPERGER. 日本物理学会 第57回年次大会. March 24, 2002-March 27, 2002.NIMS author(s)UCHIHASHI, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-18 02:31:05 +0900 Updated at: 2018-05-30 18:49:58 +0900