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放射光ナノ顕微分光によるエネルギーデバイス界面のオペランド測定
(Operando analysis of interfaces in energy devices using a high spatial resolution scanning photoelectron microscopy with synchrotron radiation soft X-rays)
第77回応用物理学会秋季学術講演会. September 13, 2016-September 16, 2016. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:37:49 +0900 Updated at: 2024-03-05 11:46:28 +0900