SAMURAI - NIMS Researchers Database

NIMS Award Symposium 2026

HOME > Presentation > Detail

Microtomagraphy Using Conventional X-ray Sources.
(通常X線源を用いた顕微断層撮影.)

YAMAUCHI, Yasushi, 岸本直樹, 生田孝, 岸本直樹, 生田孝.
6th International Symposium on Nondestructive Characterization. June 07, 1993-June 11, 1993.

NIMS author(s)


    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2017-02-18 00:42:14 +0900 Updated at: 2023-04-09 14:58:16 +0900

      ▲ Go to the top of this page