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(Double-scanning-probe tunneling microscope / atomic force microscope for electrical measurements of nanostructures )
US-Japan Young Scientists Symposium on Nanotechnology. 2006-10-30.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:09:04 +0900 Updated at: 2017-07-10 19:46:50 +0900