(Double-scanning-probe tunneling microscope / atomic force microscope for electrical measurements of nanostructures )
US-Japan Young Scientists Symposium on Nanotechnology. 2006.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-02-14 11:09:04 +0900更新時刻: 2017-07-10 19:46:50 +0900