HOME > Presentation > DetailRecent advances in quantitative analysis of transmission electron microscopy and its application to grain boundary phenomena井 誠一郎. Institute of Nanotechnology (INT) Seminar Series. 2015. InvitedNIMS author(s)II, SeiichiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 03:47:08 +0900Updated at: 2024-03-05 11:45:59 +0900