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ＣｅＯ2を用いたＳＯＩ構造ーCeO2/Si界面の電気特性の評価ー
(Electorical characterization of ＣｅＯ2/Ｓi inteface for ＳＯＩ structure )
１９９４年（平成６年）秋季,第５５回応用物理学会学術講演会. September 19, 1994-September 22, 1994.
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Created at: 2017-02-18 00:52:17 +0900 Updated at: 2017-07-10 17:29:54 +0900