HOME > Presentation > DetailThermal recovery of damage in SiO2/Si structure implanted with copper negative-ions(銅負イオン照射されたSiO2/Si構造のダメージの熱的回復過程)AMEKURA, Hiroshi, 李致圭, KISHIMOTO, Naoki, 李致圭. 第13回日本MRS学術シンポジウム. December 20, 2001-December 21, 2001.NIMS author(s)AMEKURA, HiroshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-18 02:28:26 +0900 Updated at: 2023-04-09 15:22:46 +0900