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細胞培養後の生体用金属材料表面のTOF-SIMS測定
(TOF-SIMS Investigation of Metallic Material Surfaces after Culturing Cells)
The 14th International Conference on Secondary Ion Mass Spectrom. September 14, 2003-September 19, 2003.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 03:18:47 +0900 Updated at: 2017-07-10 18:42:38 +0900