HOME > Presentation > Detail高エネルギー軽イオン照射損傷の低温におけるその場光伝導計測.(In-Situ Photoconductivity Measurement under High-Energy Ion Irradiation at Low Temperatures.)雨倉 宏, 岸本直樹, 斎藤鉄哉, 岸本直樹, 斎藤鉄哉. 日本金属学会. October 16, 1993-October 18, 1993.NIMS author(s)AMEKURA, HiroshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-18 00:44:33 +0900 Updated at: 2017-07-10 17:25:34 +0900