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ウェッジ法による窒化物半導体のTEM試料作製
(Sample preparation of GaN based materials using a wedge polishing technique)
JSM'07. 日本顕微鏡学会第63回学術講演会. May 20, 2007-May 22, 2007.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:02:22 +0900 Updated at: 2017-07-10 19:55:16 +0900