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Utilization of Scanning SQUID Microscopy for Characterization of Superconducting Thin Films
(走査SQUID顕微鏡による超伝導薄膜評価法)
The 21st Annual International Conference on composite/nano engin. July 21, 2013-July 27, 2013. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-09-05 14:09:01 +0900 Updated at: 2024-03-05 11:44:30 +0900