(Development of Laboratory Hard X-ray Photoelectron Spectroscopy system and Application to Measurement of SiO2 Thickness on Si(001))
VUVX 2010. 2010.
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 04:44:15 +0900更新時刻: 2017-07-10 20:47:45 +0900