HOME > Presentation > DetailThe semiconductor to metal transition in FeSi1-xGex probed by high resolution x-ray absorption spectroscopyTSUJII, Naohito. International Conference on Strongly Correlated Electron Systems. May 13, 2007-May 18, 2007.NIMS author(s)TSUJII, NaohitoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 11:57:47 +0900 Updated at: 2022-09-05 11:57:47 +0900