Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope
Microscopy & Microanalysis 2010 Meeting. 2010.
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2022-09-05 12:51:15 +0900更新時刻: 2022-09-05 12:51:15 +0900