HOME > Presentation > Detail
GaN:Eu赤色LEDのノイズ分析：発光中心の電荷捕獲特性を知る新しいアプローチ
(Noise analyses of GaN:Eu red LED:A new application to measure charge capturing properties of emission centers)
第76回応用物理学会秋季学術講演会. September 13, 2015-September 16, 2015.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:50:23 +0900 Updated at: 2017-07-10 22:12:26 +0900