HOME > Presentation > Detail(Thermoelectric properties of a narrow gap semiconductor FeSi1-xGex near ferromagnetic instability)辻井 直人, 北澤 英明, 櫻井 裕也. IUMRS - International Conference on Electronic Materials 2012. 2012.NIMS author(s)TSUJII, NaohitoKITAZAWA, HideakiSAKURAI, HiroyaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:44:16 +0900Updated at: 2017-07-10 21:20:32 +0900