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Optical Characteristics of Single-crystal GeSn Thin Wires Fabricated by Local Liquid Phase Crystallization
The 10th International Symposium on Control of Semiconductor Interfaces (ISCSI-X), the International Conference on Silicon Epitaxy and International SiGe Technology and Device Meeting (ICSI/ISTDM 2025). November 10, 2025-November 13, 2025. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2026-06-03 03:08:15 +0900 Updated at: 2026-06-03 03:08:15 +0900
