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希土類添加半導体の発光機構解明へ少し変わったアプローチ X線で見えるもの 電気測定で分かること
(Eccentric approaches to luminescence mechanism of rare-earth doped semiconductors: Information to be found by using x-ray and electric measurements)
Mesoscopic Materials Research Laboratory Seminar. 2013-04-30. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:31:41 +0900 Updated at: 2024-03-05 11:44:30 +0900