(Hard x-ray photoemission spectroscopy used to investigate the resistive switching behavior of manganite heterostructures: the case of Ti/PrCaTiO3 interface)
59th AVS international Symposium. 2012.
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作成時刻: 2017-02-14 11:10:49 +0900更新時刻: 2017-07-10 21:37:28 +0900