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(Impact of Cation Composition and Surface Orientation on Electrical Properties of ALD-Al2O3/III-V Interfaces)

安田哲二, 宮田典幸, 石井裕之, 板谷太郎, 市川麿, 福原昇, 秦雅彦, 大竹 晃浩, 灰本隆志, 星井拓也, 竹中充, 高木信一.
IEEE Semiconductor Interface Specialists Conference. 2008.

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    Created at: 2017-02-14 10:54:58 +0900Updated at: 2017-07-10 20:23:58 +0900

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