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Spectromicroscopy analysis of interface dipole layers in 2D-material based field effect transistors
(原子層電界効果トランジスタにおける界面双極子の放射光X線顕微分光観測)

NAGAMURA, Naoka, 吹留博一, 長汐晃輔, 尾嶋正治.
第30回日本MRS年次大会. December 09, 2020-December 11, 2020.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2022-01-12 03:00:39 +0900Updated at: 2022-01-12 03:00:39 +0900

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