HOME > Presentation > DetailSpectromicroscopy analysis of interface dipole layers in 2D-material based field effect transistors(原子層電界効果トランジスタにおける界面双極子の放射光X線顕微分光観測)NAGAMURA, Naoka, 吹留博一, 長汐晃輔, 尾嶋正治. 第30回日本MRS年次大会. December 09, 2020-December 11, 2020.NIMS author(s)NAGAMURA, NaokaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-01-12 03:00:39 +0900Updated at: 2022-01-12 03:00:39 +0900