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X 線回折における異常散乱現象を用いたZnO 薄膜の極性判定
(Polarity determination of ZnO films by x-ray diffraction using anomalous dispersion)
第26回日韓国際セラミックスセミナー. November 24, 2009-November 26, 2009.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:59:06 +0900Updated at: 2017-07-10 20:34:12 +0900