HOME > Presentation > DetailSb-doped Mg2Si0.5Sn0.5の熱処理による微細構造及び熱電性質変化のTEM解析(Effect of annealing on microstructure and thermoelectric properties of Sb-doped Mg2Si0.5Sn0.5 studied with TEM)長谷川 明, リュウ ジウェイ, 竹口 雅樹, 辻井 直人, 磯田 幸宏. 日本顕微鏡学会第71回学術講演会. May 13, 2015-May 15, 2015.NIMS author(s)HASEGAWA, AkiraTAKEGUCHI, MasakiTSUJII, NaohitoISODA, YukihiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:19:30 +0900Updated at: 2017-07-10 22:06:32 +0900