HOME > Presentation > Detail超伝導X線検出器を応用した超高精度分析電子顕微鏡(Superconducting x-ray detector for precise compositional analysis in STEM)原 徹. NIMS WEEK 2016. 2016.NIMS author(s)HARA, ToruFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-19 04:37:00 +0900Updated at: 2017-07-10 22:34:20 +0900