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(Low-temperature and in-field scanning Hall-probe microscopy for MgB2 wire characterization)

K. Higashikawa, A. Yamamoto, L. He, K. Shiohara, K. Imamura, M. Inoue, T. Kiss, 松本 明善, 熊倉 浩明.
ASC2012. October 07, 2012-October 12, 2012.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-14 11:46:18 +0900 Updated at: 2017-07-10 21:29:52 +0900

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