HOME > Presentation > DetailSiおよびGeナノワイヤへの不純物ドーピングと評価(Doping and characterization of impurity atoms in Si and Ge nanowires)深田 直樹. IWAMSN2012. October 30, 2012-November 02, 2012. InvitedNIMS author(s)FUKATA, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:57:21 +0900 Updated at: 2024-03-05 11:44:13 +0900