HOME > Presentation > Detail(Optimization of cathodoluminescnece condition for the study of ZnO nanoparticles)関口 隆史, ディエール バンジャマン, 袁 暁利, 大橋 直樹, 横山 政昭. Beam Injection Assessment of Microstructures in Semiconductors. 2006.NIMS author(s)OHASHI, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-25 01:12:28 +0900Updated at: 2017-07-10 19:37:25 +0900