SAMURAI - NIMS Researchers Database

HOME > Presentation > Detail

Quantitative analyses by transmission electron microscopy and those applications to the grain boundary phenomena

International conference on Frontiers in Materials Processing,. 2015. Invited

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at :2017-02-14 11:39:49 +0900 Updated at :2024-03-05 11:45:21 +0900

    ▲ Go to the top of this page