HOME > Presentation > Detail(Fabrication and characterization by fine focused electron beam with scanning transmission electron microscopy)古屋 一夫, 三石 和貴, 下条 雅幸, 田中 美代子. 8th Asia-Pacific Conference on Electron Microscopy. 2004. InvitedNIMS author(s)MITSUISHI, KazutakaTANAKA, MiyokoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-22 23:03:46 +0900Updated at: 2024-03-05 11:40:13 +0900