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電流-電圧特性計測と表面増強ラマン計測による単分子接合の構造変化の追跡
(The Analysis of Structure Change in Single Molecular Junction by Electronic and Surface Enhanced Raman Spectrum Measurement)
第67回応用物理学会 春季学術講演会. March 12, 2020-March 15, 2020.
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Created at: 2020-03-14 03:00:21 +0900Updated at: 2020-03-14 03:00:21 +0900